5 results
Atomic Resolution Investigation of Ultra-Low Energy Ion-Implanted Monolayer TMDs Using Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2538-2540
- Print publication:
- August 2022
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Controlled Functionalisation of 2-D Materials for Quantum Device Development: assessment of Single Atom Behaviour via Atomic Resolution Electron Microscopy and Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2558-2559
- Print publication:
- August 2020
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New Single Photon Sources by Optoelectronic Tailoring of 2D Materials Using Low Energy Ion Implantation
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2832-2833
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- August 2020
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Aberration Corrected Off-Axis Electron Holography of Layered Transition Metal Dichalcogenides
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1399-1400
- Print publication:
- August 2015
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In Situ Transmission Electron Microscopy Observations of Silicidation Processes for Cobalt Thin Films Deposited on Silicon
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- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue 3 / June 1998
- Published online by Cambridge University Press:
- 28 July 2005, pp. 317-324
- Print publication:
- June 1998
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